Thin film devices, composed of layers of materials a few nanometers thick, play an important role in various technologies, from semiconductors to communication technologies. For instance, graphene and ...

Dendritic structures that emerge during the growth of thin films are a major obstacle in large-area fabrication, a key step towards commercialization. However, current methods of studying dendrites ...

Single wavelength ellipsometry (SWE), which is currently used for ultra-thin film measurement, only works for single layer films and is relatively slow. Multi-layer high-K metal gate (HKMG) film ...

Ellipsometers are incredibly useful for non-destructive and non-contact optical property measurements of single-layer and multi-layer thin film samples on a variety of substrate materials. The ...

Scalable method rapidly creates stable, flexible carbon nanoparticle films using only water and oil, enabling precise, ...

In previous studies of thin film wrinkling on soft substrates, the mechanics models usually assume plane-strain deformation, which was found to disagree with experimental observations for narrow thin ...

For instance, graphene and hexagonal-boron nitride (h-BN) multilayer thin films, deposited on copper substrates, are promising materials for next-generation high-speed communications systems. Thin ...

Thin film devices, composed of layers of materials a few nanometers thick, play an important role in various technologies, from semiconductors to ...

Thin films are grown by depositing tiny layers of materials onto a substrate. The growth process conditions ... particularly in the early growth stage and multilayer films. Since the microstructure ...