Agentic design patterns: The missing link between AI demos and enterprise value

A recent study by MIT’s Project NANDA highlighted a sobering statistic: Roughly 95% of AI projects fail to deliver ...
Semiconductor Engineering

Power-Aware Revolution In Automated Test For ICs

As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...
Electronic Design

Using Timing Constraints For Generating At-Speed Test Patterns

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...
Semiconductor Engineering

Challenges And Outlook Of ATE Testing For 2nm SoCs

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
Electronic Design

Simulation Mismatches Can Foul Up Test-Pattern Verification

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...
Forbes

Ten Steps To Getting Started With Automated Software Testing

As the founder and CEO of an automated software testing company, I’ve been following the trends in this space closely, and it's exciting to see that the automation testing market is estimated to more ...